| Precision |
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Wavefront: 3nm rms. |
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| Number of spots |
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Up to 70x70. Limited by size of detector. |
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| Zernike polynomials |
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Annular, Standard or Fringe Zernikes as well as Seidel polynomial terms can be selected (more than 50 different terms). |
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| Output from analysis |
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Focus, coma, spherical aberration, astigmatism, and other higher order aberrations (more than 50 terms), 80% EE, wavefront/mirror surface, and Strehl ratio. |
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| Graphical output |
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Spot diagrams, EE profile and distribution of residuals over the pupil. 3D and contour plot of wavefront or mirror surface. MTF, PSF and EE profile from spot diagrams. |
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| Diagnostics |
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Given the telescope parameters, Sensoft suggests the changes required to correct defocus, coma and spherical aberration. |
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| Support problems of the optical mountings |
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Support problems of the mountings can be identified from the contour plots of the wavefront after subtracting out the lower-order aberration terms. |
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| Reduce noise due to air effects |
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At the telescope, in the laboratory and in the manufacturing workshop, air-turbulence effects can limit the accuracy of the analysis. Sensoft has the facility for averaging coefficients from multiple frames to improve the accuracy. |